SiC/GaN Compatible Power Device Tester (Semiconductor Tester)
In order to accommodate new materials such as SiC and GaN, we will develop measurement and fixture solutions for high voltage and high-speed switching applications.
The power device testers "N50 Series" and "N54 Series" are products specialized for discrete semiconductors and small-scale logic devices. We also develop measurement and fixtures that can accommodate SiC and GaN devices according to your needs. 【Product Lineup】 ＜"N50 Series" (200V rated voltage)＞ ■ Equipped with FPGA for full logic synchronization within the tester, enabling high-speed measurements ■ Compact size for easy integration into handlers ■ Measurement items: static characteristics, thermal resistance, L-load ＜"N54 Series" (2000V rated voltage)＞ ■ High voltage resistance & low impedance ■ Achieves di/dt = 20kA/μS ■ Measurement items: static characteristics, thermal resistance, short-circuit withstand, switching characteristics, RBSOA/RRSOA *For more details, please refer to the materials. Feel free to contact us with any inquiries.
- Company：日本技術センター
- Price：Other
